GAZI UNIVERSITY INFORMATION PACKAGE - 2019 ACADEMIC YEAR

COURSE DESCRIPTION
X-RAYS TECHNOLOGIES AND APPLICATIONS/5381302
Course Title: X-RAYS TECHNOLOGIES AND APPLICATIONS
Credits 3 ECTS 7.5
Semester 1 Compulsory/Elective Elective
COURSE INFO
 -- LANGUAGE OF INSTRUCTION
  Turkish
 -- NAME OF LECTURER(S)
  Assoc.Prof. Mustafa Kemal ÖZTÜRK
 -- WEB SITE(S) OF LECTURER(S)
  www.gazi.edu.tr/~ozturkm
 -- EMAIL(S) OF LECTURER(S)
  ozturkm@gazi.edu.tr
 -- LEARNING OUTCOMES OF THE COURSE UNIT
Basic Concepts, X-Ray Optics, Bragg Brentano geometry
Qualitative and Quantitative Analysis, Phase Diagrams identification, crystal size, crystal perfection, the crystal orientation
X-Ray Reflection (XRR), amorphous, crystalline, Determination of Surface and Interfacial Roughness for the organic and non-organic films and Thicknes
Treatment Rietveld Method, Analysis software (Topas, Jade, X'Pert Highscore, ...)
High-resolution X-ray diffraction (HRXRD), Three-axis scattering, Symmetric and Asymmetric Locked Coupled, Theta, 2-Theta, omega/2-thet, Phi measureme
lattice strain in the Formal Functional Materials, Lattice Mismatch, Composition, Thickness, Bending, Twist and Propagation of Mosaic, Dislocation, La
small and wide incidence angle (GIA XD), Diffraction Imaging and Mapping defects, dislocation Views
Small and Wide Angle X-Ray Scattering Techniques and Applications (Biological Nano-molecules Size, Shape and Distribution ...)
Stress, spouse and semi-Bending Mode, permanent and shear stress, sin2  Method,
X-Ray Based Analysis Techniques (X-Ray Microscopy, lithography, topography, tomography ...)
 -- MODE OF DELIVERY
  The mode of delivery of this course is Face to face
 -- PREREQUISITES AND CO-REQUISITES
  There is no prerequisite or co-requisite for this course.
 -- RECOMMENDED OPTIONAL PROGRAMME COMPONENTS
  Solid state
 --COURSE CONTENT
1. Week  Basic Concepts, X-Ray Optics, Bragg Brentano geometry
2. Week  Qualitative and Quantitative Analysis, Phase Diagrams identification, crystal size, crystal perfection, the crystal orientation
3. Week  Treatment Rietveld Method, Analysis software (Topas, Jade, X'Pert Highscore, ...)
4. Week  X-Ray Reflection (XRR), amorphous, crystalline, Determination of Surface and Interfacial Roughness for the organic and non-organic films and Thicknes
5. Week  High-resolution X-ray diffraction (HRXRD), Three-axis scattering, Symmetric and Asymmetric Locked Coupled, Theta, 2-Theta, omega/2-thet, Phi measureme
6. Week  lattice strain in the Formal Functional Materials, Lattice Mismatch, Composition, Thickness, Bending, Twist and Propagation of Mosaic, Dislocation, La
7. Week  Reciprocal Mapping (RSM), Scanning of Lattice Relaxation
8. Week  MID-TERM
9. Week   small and wide incidence angle (GIA XD), Diffraction Imaging and Mapping defects, dislocation Views
10. Week  Small and Wide Angle X-Ray Scattering Techniques and Applications (Biological Nano-molecules Size, Shape and Distribution ...)
11. Week  Stress, spouse and semi-Bending Mode, permanent and shear stress, sin2  Method,
12. Week  X-Ray Absorption and Emission Techniques
13. Week  X-Ray Based Analysis Techniques (X-Ray Microscopy, lithography, topography, tomography ...)
14. Week  Current Practices.
15. Week  Current Practices (continued).
16. Week  Current Practices (continued).
 -- RECOMMENDED OR REQUIRED READING
  1)X-Işınları Difraksiyonu (Cullity) 2)X-ray Metrology in Semiconductor Manufacturing, (D. Keith Bowen, Brian K. Tanner) 2006 by Taylor & Francis Group, LLC 3)X-ray diffraction, C. Suryanarayana and M Grand Norton 4) Günther Bauer, Wolfgang Ricther, Optical Characterization of Epitaxial Semiconductor Layers, Springer-Verlag, Berlin, 19962) S. Perkowitz, Optical Characterization of Epitaxial semiconductor layers, Academic Pres Limited, London, 1993 5)Handbook of X-Ray Spectrometry: Methods and Techniques (Practical Spectroscopy, Vol 14) [Hardcover] Rene E. Van Grieken (Author), R. Van Grieken(Editor), Andrzej A. Markowicz (Editor)
 -- PLANNED LEARNING ACTIVITIES AND TEACHING METHODS
   Application with X-Ray device
 -- WORK PLACEMENT(S)
  Aplication with X-Ray
 -- ASSESSMENT METHODS AND CRITERIA
 
Quantity
Percentage
 Mid-terms
1
10
 Assignment
1
5
 Exercises
3
10
 Projects
1
5
 Practice
3
5
 Quiz
1
5
 Contribution of In-term Studies to Overall Grade  
40
 Contribution of Final Examination to Overall Grade  
60
 -- WORKLOAD
 Efficiency  Total Week Count  Weekly Duration (in hour)  Total Workload in Semester
 Theoretical Study Hours of Course Per Week
12
3
36
 Practising Hours of Course Per Week
12
1
12
 Reading
6
1
6
 Searching in Internet and Library
8
3
24
 Designing and Applying Materials
0
0
0
 Preparing Reports
0
0
0
 Preparing Presentation
12
5
60
 Presentation
12
2
24
 Mid-Term and Studying for Mid-Term
1
10
10
 Final and Studying for Final
1
10
10
 Other
0
 TOTAL WORKLOAD: 
182
 TOTAL WORKLOAD / 25: 
7.28
 ECTS: 
7.5
 -- COURSE'S CONTRIBUTION TO PROGRAM
NO
 PROGRAM LEARNING OUTCOMES
1
2
3
4
5
1Develop, enhance and deepen and obtain creative original definitions by combining current knowledge of the field and critical thinking and researchX
2comprehend interdisciplinary interactions and relations relevant to physics; analyze, compose, synthesize and evaluate new and complex ideas and to obtain original results by using expertise knowledge of the field,X
3obtain new scientific knowledge and gain higher level of skills in field of searchX
4develop a new scientific method in the field or apply a known method to a different problemX
5research, understand, design, adopt and apply an original subjectX
6question, compose, synthesize and evaluate new and complex ideasX
7publishtheir original works in refereed journalsX
8develop original ideas and methods in the field and also in interdisciplinary fields by using higher level skills such as creative and critical thinking, problem solving and judgmentsX
9present their works and original ideas effectively in a scientific environmentX
10communicate anddiscuss in advance level of writing, oral and visual in at least one foreign languageX
11introduce technological developmentsin anacademic and professional manner and contribute to theprogress of it societyX