GAZI UNIVERSITY INFORMATION PACKAGE - 2019 ACADEMIC YEAR

COURSE DESCRIPTION
MEASUREMENT TECH. OF SEMİCONDUCTER THİN FİLMS/5211302
Course Title: MEASUREMENT TECH. OF SEMİCONDUCTER THİN FİLMS
Credits 3 ECTS 7.5
Semester 1 Compulsory/Elective Elective
COURSE INFO
 -- LANGUAGE OF INSTRUCTION
  Turkish
 -- NAME OF LECTURER(S)
  Prof. Dr. Mehmet Mahir BULBUL
 -- WEB SITE(S) OF LECTURER(S)
  www.gazi.edu.tr/~mahir
 -- EMAIL(S) OF LECTURER(S)
  mahir@gazi.edu.tr
 -- LEARNING OUTCOMES OF THE COURSE UNIT
To support the knowledge in the Solid State Physics
To get an overview of the present measurement systems
To make easy the understanding of the Solid State and Semiconductor Physics.






 -- MODE OF DELIVERY
  The mode of delivery of this course is Face to face
 -- PREREQUISITES AND CO-REQUISITES
  There is no prerequisite or co-requisite for this course.
 -- RECOMMENDED OPTIONAL PROGRAMME COMPONENTS
  There is no recommended optional programme component for this course.
 --COURSE CONTENT
1. Week  Thin film and Growth Technics
2. Week  Structural Characterization:X-Rays Measurements
3. Week  Structural Characterization:Reflection High Enery Electron Diffraction(RHEED),Low Enery Electron Diffraction (LEED)
4. Week  Electrical Characterization:Hall Measurements
5. Week  Electrical Characterization:Deep Level Transient Spectroscopy
6. Week  Electrical Characterization:Empedans Analysing Measurements
7. Week  Optical Characterization:Photoluminescence
8. Week  Optical Characterization:Raman Spectroscopy
9. Week  Midterm Exam
10. Week  Optical Characterization:Infrared Spektroscopy
11. Week  Optical Characterization:Spectroscopic Ellipsometry
12. Week  Surface Characterization:Atomic Force Microscopi(AFM)
13. Week  Surface Characterization:Scanning Tunneling Microscopy(STM).
14. Week  Surface Characterization:Auger Electron Spectroscopy (AES)
15. Week  Surface Characterization:Photo Electron Spectroscopy (XPS,UPS)
16. Week  Final ExaM
 -- RECOMMENDED OR REQUIRED READING
  1) Günther Bauer, Wolfgang Ricther, Optical Characterization of Epitaxial Semiconductor Layers, Springer-Verlag, Berlin, 1996 2) S. Perkowitz, Opti
 -- PLANNED LEARNING ACTIVITIES AND TEACHING METHODS
  Lecture, Question & Answer, Demonstration, Drill - Practise
 -- WORK PLACEMENT(S)
  Not Applicable
 -- ASSESSMENT METHODS AND CRITERIA
 
Quantity
Percentage
 Mid-terms
1
30
 Assignment
2
20
 Exercises
0
0
 Projects
0
0
 Practice
0
0
 Quiz
0
0
 Contribution of In-term Studies to Overall Grade  
50
 Contribution of Final Examination to Overall Grade  
50
 -- WORKLOAD
 Efficiency  Total Week Count  Weekly Duration (in hour)  Total Workload in Semester
 Theoretical Study Hours of Course Per Week
14
3
42
 Practising Hours of Course Per Week
0
0
0
 Reading
14
3
42
 Searching in Internet and Library
14
3
42
 Designing and Applying Materials
0
0
0
 Preparing Reports
0
0
0
 Preparing Presentation
14
3
42
 Presentation
14
1
14
 Mid-Term and Studying for Mid-Term
1
1
1
 Final and Studying for Final
1
1
1
 Other
0
0
0
 TOTAL WORKLOAD: 
184
 TOTAL WORKLOAD / 25: 
7.36
 ECTS: 
7.5
 -- COURSE'S CONTRIBUTION TO PROGRAM
NO
 PROGRAM LEARNING OUTCOMES
1
2
3
4
5
1X
2X
3X
4X
5X
6X
7X
8X
9X
10X
11X